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Introduction to Integrated Circuits Test and Measurement (5120)

Description

  • Parametric testing techniques for analog, digital, mixed and RF ICs, DSP-based testing; noise effects on accuracy; Design-for-Test and Built-in-Self Tests. Prereq: 3020, or 323 and 351, or Grad standing in Engineering, Biological Sciences, or Math and Physical Sciences. Not open to students with credit for 625, 694 (Spring 2009), or 694.04. Units: 3 credit hours.

Subject

  • Electrical and Computer Eng (ECE)